Structured scintillator for hard x-ray grating interferometry

Sensitivity of X-ray grating interferometry.

It is known that the sensitivity of X-ray phase-contrast grating interferometry with regard to electron density variations present in the sample is related to the minimum detectable refraction angle. In this article a numerical framework is developed that allows for a realistic and quantitative determination of the sensitivity. The framework is validated by comparisons with experimental results...

Hard X-ray phase-contrast tomography of non-homogeneous specimens: grating interferometry versus propagation-based imaging.

X-ray phase-contrast imaging is an effective approach to drastically increase the contrast and sensitivity of microtomographic techniques. Numerous approaches to depict the real part of the complex-valued refractive index of a specimen are nowadays available. A comparative study using experimental data from grating-based interferometry and propagation-based phase contrast combined with single-d...

Ronchi interferometry for characterization of hard x- ray nanofocusing optics

Hard x-ray nanobeams have become an important tool in modern synchrotron radiation research with applications in many different fields like biology, chemistry, physics and material science. These nanobeams are usually created by focusing undulator radiation with highly specialized nanofocusing optics like reflective Kirkpatrick-Beaz mirror systems, diffractive zone plates or refractive compound...

Holotomography versus X-ray grating interferometry: A comparative study

X-ray grating interferometry with a liquid-metal-jet source